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Smart Structures and Systems Volume 8, Number 1, July 2011 , pages 139-155 DOI: https://doi.org/10.12989/sss.2011.8.1.139 |
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A wireless impedance analyzer for automated tomographic mapping of a nanoengineered sensing skin |
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Sukhoon Pyo, Kenneth J. Loh, Tsung-Chin Hou, Erik Jarva and Jerome P. Lynch
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Abstract | ||
Polymeric thin-film assemblies whose bulk electrical conductivity and mechanical performance have been enhanced by single-walled carbon nanotubes are proposed for measuring strain and corrosion activity in metallic structural systems. Similar to the dermatological system found in animals, the proposed self-sensing thin-film assembly supports spatial strain and pH sensing via localized changes in electrical conductivity. Specifically, electrical impedance tomography (EIT) is used to create detailed mappings of film conductivity over its complete surface area using electrical measurements taken at the film boundary. While EIT is a powerful means of mapping the sensing skin | ||
Key Words | ||
structural health monitoring; sensing skin; wireless sensor; carbon nanotube; bio-inspired sensing; impedance tomography. | ||
Address | ||
Sukhoon Pyo: Dept. of Civil & Environmental Engineering, University of Michigan, Ann Arbor, MI 48109, USA Kenneth J. Loh: Dept. of Civil & Environmental Engineering, University of California, Davis, CA 95616, USA Tsung-Chin Hou: Dept. of Civil Engineering, National Cheng Kung University(NCKU), Tainan, Taiwan Erik Jarva: Dept. of Electrical Engineering & Computer Science, University of Michigan, Ann Arbor, MI 48109, USA Jerome P. Lynch: Dept. of Civil & Environmental Engineering, University of Michigan, Ann Arbor, MI 48109, USA, Dept. of Electrical Engineering & Computer Science, University of Michigan, Ann Arbor, MI 48109, USA | ||