Techno Press
You logged in as Techno Press

Smart Structures and Systems
  Volume 19, Number 2, February 2017, pages 195-202
DOI: http://dx.doi.org/10.12989/sss.2017.19.2.195
 


Calculus of the defect severity with EMATs by analysing the attenuation curves of the guided wave
Carlos Q. Gómez, Fausto P. García, Alfredo Arcos, Liang Cheng, Maria Kogia and Mayorkinos Papelias

 
Abstract     [Full Text]
    The aim of this paper is to develop a novel method to determine the severity of a damage in a thin plate. This paper presents a novel fault detection and diagnosis approach employing a new electromagnetic acoustic transducer, called EMAT, together with a complex signal processing method. The method consists in the recognition of a fault that exists within the structure, the fault location, i.e. the identification of the geometric position of damage, and the determining the significance of the damage, which indicates the importance or severity of the defect. The main scientific novelties presented in this paper is: to develop of a new type of electromagnetic acoustic transducer; to incorporate wavelet transforms for signal representation enhancements; to investigate multi-parametric analysis for noise identification and defect classification; to study attenuation curves properties for defect localization improvement; flaw sizing and location algorithm development.
 
Key Words
    fault detection and diagnosis; electromagnetic acoustic transducers; EMAT; wavelet transform; non destructive testing; attenuation curves; guided waves
 
Address
Carlos Q. Gómez, Fausto P. García and Alfredo Arcos: Ingenium Research Group, Castilla-La Mancha University, Spain
Liang Cheng: Brunel Innovation Centre, Brunel University, UK
Mayorkinos Papelias: School of Metallurgy and Materials, University of Birmingham, Birmingham, UK
 

Techno-Press: Publishers of international journals and conference proceedings.       Copyright © 2020 Techno Press
P.O. Box 33, Yuseong, Daejeon 305-600 Korea, Tel: +82-42-828-7996, Fax : +82-42-828-7997, Email: technop@chol.com