Techno Press


Steel and Composite Structures   Volume 19, Number 1, July 2015, pages 173-190
DOI: http://dx.doi.org/10.12989/scs.2015.19.1.173
 
Fragility assessment of buckling-restrained braced frames under near-field earthquakes
Ahmad F. Ghowsi and Dipti R. Sahoo

 
Abstract     [Full Text]
    This study presents an analytical investigation on the seismic response of a medium-rise buckling-restrained braced frame (BRBF) under the near-fault ground motions. A seven-story BRBF is designed as per the current code provisions for five different combinations of brace configurations and beam-column connections. Two types of brace configurations (i.e., Chevron and Double-X) are considered along with a combination of the moment-resisting and the non-moment-resisting beam-to-column connections for the study frame. Nonlinear dynamic analyses are carried out for all study frames for an ensemble of forty SAC near-fault ground motions. The main parameters evaluated are the interstory and residual drift response, brace displacement ductility, and plastic hinge mechanisms. Fragility curves are developed using log-normal probability density functions for all study frames considering the interstory drift ratio and residual drift ratio as the damage parameters. The average interstory drift response of BRBFs with Double-X brace configurations significantly exceeded the allowable drift limit of 2%. The maximum displacement ductility characteristics of BRBs is efficiently utilized under the seismic loading if these braces are arranged in the Double-X configurations instead of Chevron configurations in BRBFs located in the near-fault regions. However, BRBFs with the Double-X brace configurations exhibit the higher interstory drift and residual drift response under near-fault ground motions due to the formation of plastic hinges in the columns and beams at the intermediate story levels.
 
Key Words
    buckling-restrained braces; fragility curves; near-fault regions; seismic analysis; steel frames
 
Address
Department of Civil Engineering, Indian Institute of Technology Delhi, New Delhi-110016, India.
 

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